Topic: Control, stability, and testing of grid-forming inverters towards inverter-based power systems

Lecturer: Prof. Alexandros Paspatis, Manchester Metropolitan University

Time: May 12, 2026, 14:30, UTC+8

Venue: Room 327, Qiushi Building

Organizer: School of Automation

Biography: Prof. Alexandros Paspatis received his M.Sc. degree in Electrical and Computer Engineering from Democritus University of Thrace, Greece, in 2016, and his Ph.D. degree in Automatic Control and Systems Engineering from the University of Sheffield, UK, in 2020. He served as a Research Assistant at the University of Sheffield in 2018. From 2020 to 2023, he worked as a Postdoctoral Researcher at the National Technical University of Athens, Greece, and a part-time Lecturer at the Mediterranean University, Greece. Since 2023, he has been a Senior Lecturer at Manchester Metropolitan University, UK. His main research interests include power converter control, converter drive stability, microgrids, and experimental verification methods. He has led and participated in several research projects in the field of power systems, publishing over 50 peer-reviewed journal papers, conference papers, and book chapters. He is currently a Senior Member of IEEE, a Fellow of IET, a Fellow of the Higher Education Academy (UK), and a member of the Greek Technical Committee. He also serves as an Associate Editor for the IEEE Transactions on Industrial Electronics and as a technical program committee member for several top IEEE conferences.

Abstract: This lecture will first focus on the challenges faced by modern inverter-based power systems in terms of control and stability. It will then introduce the latest research progress in the modeling and control of Inverter-Based Resources (IBR), with a particular focus on the “Grid-Forming” inverter technology paradigm. Furthermore, the report will present new analytical methods, advanced control strategies to ensure stable and reliable system operation under both normal and abnormal grid conditions, as well as advanced hardware-in-the-loop testing methods.

Rewritten by: Li Huihui

Edited by: Mei Mengqi, Li Tiantian

Source: School of Automation